IEC 61032 Test Probes for Verification and Testing The Protection Against Access to Hazardous Parts

Model	Describe	Reference   standard	Specification
LX-1201	IEC 61032 Fig. 1 - test probe A	IEC 60529 IEC 61032	Ball Dia.: 50 mm Baffle plate Dia.: 45 mm Baffle plate thickness: 4 mm Handle Dia.: 10 mm Handle length: 100 mm Material: Nylon + stainless steel
LX-1202	IEC 61032 Fig. 2 - test probe b	IEC 60529 IEC 61032 IEC 60335 IEC 60884 IEC 60745 IEC 60045 IEC 60950 IEC 60238 IEC 60601 IEC 60968 IEC 61010 IEC 60065	Knurled   finger Dia.: 12 mm Knurler finger length: 80 mm Baffle plate Dia.: 50 mm Baffle plate length: 100 mm Baffle thickness: 20 mm
LX-1203	IEC 61032 Fig. 3 - Test probe C	IEC 61032 IEC 60529	Test probe length: 100 mm Test probe Dia.: 2.5 mm Dam-sphere Dia.: 35 mm Handle Dia.: 10 mm Handle length: 100 mm Material: Nylon + hardened steel
LX-1204	IEC 61032 Fig. 4 - Test probe D	IEC 61032 IEC 60529	Test probe length: 100 mm Test probe Dia.: 1 mm Dam-sphere Dia.: 35 mm Handle Dia.: 10 mm Handle length: 100 mm Material: Nylon + hardened steel
LX-B500	IEC 61032 Fig. 5 – Test probe 1	IEC 61032	Dia.: 50 mm Weight: 500 g
LX-B015	IEC 61032 Fig. 6 – Test probe 2	IEC 61032	Dia.: 12.5 mm Weight: 15 g
LX-1211	IEC 61032 Fig. 7 – Test probe 11	IEC 61032 IEC 60065 IEC 60335-1 IEC 60884-1 IEC 60238 IEC 60950 IEC 61010	Nodular Finger length: 80 mm Nodular Finger Dia.: 12 mm Dam-board Dia.: 50 mm Dam-board thickness: 5 mm Material: Nylon and stainless steel
LX-1213	IEC 61032  Fig. 9 – test probe 13	IEC 60065 IEC 60335-1 IEC 60950 IEC 61302 IEC 60601 IEC 60745	Test probe Dia.: head 3 mm, tail 4 mm Test probe length: 15 mm Dam-board Dia.: 25 mm Dam-board thickness: 5 mm Material: Handle is made of Nylon, tip is stainless steel
LX-1212	IEC 61032 Fig. 8 – Test probe 12	IEC 61032	Test probe Dia.: 4 mm Test probe length: 50 mm Dam-board Dia.: 25 mm Dam-board thickeness: 4 mm Material: Handle is made of Nylon, tip is stainless steel
LX-1219	IEC 61032 Fig. 13 – Test probe 19 (small finger probe Φ 5.6)	IEC 61032 EN71 ASTM F963	Knurled finger Dia.:   φ5.6 mm Head radius: 2.8 mm Knurled finger length: 44 mm(Three knurls,16.7 mm   knurl) Material: Nylon and stainless steel
LX-1218	IEC 61032 Fig. 12 – Test probe 18 (small finger probe Φ 8.6)	IEC 61032 EN71 ASTM F963	Knurled finger Dia.: φ8.6 mm Head radius: 4.3 mm Knurled finger length: 57.9 mm (Three knurls,19.3 mm knurl) Material: Nylon and stainless steel
LX-1231	IEC 61032 Fig. 14 – Test probe 31	IEC 61032	Test Rod Dia.: φ25 mm Rigid Finger length: 80 mm Dam-board Dia.: 60-110 mm
LX-1232	IEC 61032 Fig. 15 – Test probe 32	IEC 61032	Test   Rod Dia.: φ25 mm Dam-board Dia.: 50 mm
LX-1241	IEC 61032 Fig. 16 – Test probe 41	IEC 61032	Test Rod Dia.: 30 mm Rigid Finger length: 80 mm Handle Dia.: 50 mm Handle length: 80 mm
LX-1243	IEC 61032 Fig. 17 – Test probe 43	IEC 61032	Bar wide: 50 mm Thickness: 5 mm

HK LEE HING INDUSTRY CO., LTD are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.

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If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.


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